Broad-band soft X-ray polarimetry

Broad-band soft X-ray polarimetry

We developed an instrument design capable of measuring linear X-ray polarization over a broad-band using conventional spectroscopic optics, using a method previously described by Marshall (2008) involving laterally graded, multilayer-coated flat mirrors. We present possible science investigations wi...

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Bibliographic Details
Main Authors: Schulz, Norbert S. (Contributor), Murphy, Kendrah Dawn (Contributor), Marshall, Herman (Author), Heilmann, Ralf K (Author)
Other Authors: MIT Kavli Institute for Astrophysics and Space Research (Contributor), Marshall, Herman Lee (Contributor), Heilmann, Ralf K. (Contributor)
Format: Article
Language:English
Published: SPIE, 2011-03-09T15:26:16Z.
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