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61637 |
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|a Schulz, Norbert S.
|e author
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|a MIT Kavli Institute for Astrophysics and Space Research
|e contributor
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|a Marshall, Herman Lee
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|a Marshall, Herman Lee
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|a Heilmann, Ralf K.
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|a Schulz, Norbert S.
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|a Murphy, Kendrah Dawn
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|a Murphy, Kendrah Dawn
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|a Marshall, Herman
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|a Heilmann, Ralf K
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|a Broad-band soft X-ray polarimetry
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|b SPIE,
|c 2011-03-09T15:26:16Z.
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|z Get fulltext
|u http://hdl.handle.net/1721.1/61637
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|a We developed an instrument design capable of measuring linear X-ray polarization over a broad-band using conventional spectroscopic optics, using a method previously described by Marshall (2008) involving laterally graded, multilayer-coated flat mirrors. We present possible science investigations with such an instrument and two possible configurations. This instrument could be used in a small orbiting mission or scaled up for the International X-ray Observatory. Laboratory work has begun that would demonstrate the capabilities of key components.
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|a United States. National Aeronautics and Space Administration (NASA) (contract SV3-73016)
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|a en_US
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|a Article
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|t Proceedings of SPIE--the International Society for Optical Engineering
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