Finite-geometry models of electric field noise from patch potentials in ion traps

Finite-geometry models of electric field noise from patch potentials in ion traps

We model electric field noise from fluctuating patch potentials on conducting surfaces by taking into account the finite geometry of the ion trap electrodes to gain insight into the origin of anomalous heating in ion traps. The scaling of anomalous heating rates with surface distance d is obtained f...

Full description

Bibliographic Details
Main Authors: Low, Guang Hao (Contributor), Herskind, Peter F. (Author), Chuang, Isaac L. (Contributor)
Other Authors: Massachusetts Institute of Technology. Department of Physics (Contributor), Massachusetts Institute of Technology. Research Laboratory of Electronics (Contributor), MIT-Harvard Center for Ultracold Atoms (Contributor), Chuang, Isaac (Contributor), Toksoz, Peter F. (Contributor)
Format: Article
Language:English
Published: American Physical Society (APS), 2012-03-02T18:28:21Z.
Subjects:
Article
Online Access:Get fulltext

Internet

Get fulltext

Similar Items