Stabilization of highly polarized PbTiO[subscript 3] nanoscale capacitors due to in-plane symmetry breaking at the interface

Stabilization of highly polarized PbTiO[subscript 3] nanoscale capacitors due to in-plane symmetry breaking at the interface

Stable ferroelectric (FE) phases in nanometer-thick films would enable ultra-high density and fast FE field effect transistors (FeFETs), and the stability of ferroelectricity in ultrathin films has been under intense theoretical and experimental investigation. Here we predict, using density function...

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Bibliographic Details
Main Authors: Polanco, Miguel Angel Mendez (Author), Grinberg, Ilya (Author), Kolpak, Alexie M. (Contributor), Levchenko, Sergey V. (Author), Pynn, Christopher (Author), Rappe, Andrew M. (Author)
Other Authors: Massachusetts Institute of Technology. Department of Mechanical Engineering (Contributor)
Format: Article
Language:English
Published: American Physical Society, 2012-08-29T14:02:11Z.
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