Processing and properties of ytterbium-erbium silicate thin film gain media

Processing and properties of ytterbium-erbium silicate thin film gain media

The structural and photoluminescence properties of ytterbium-erbium silicate thin films have been investigated. The films were fabricated by RF-magnetron co-sputtering of Er[subscript 2]O[subscript 3], Yb[subscript 2]O[subscript 3] and SiO[subscript 2] on c-Si and subsequent annealing in N[subscript...

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Main Authors: Vanhoutte, Michiel (Contributor), Wang, Bing (Contributor), Michel, Jurgen (Contributor), Kimerling, Lionel C. (Contributor)
Other Authors: MIT Materials Research Laboratory (Contributor), Massachusetts Institute of Technology. Department of Materials Science and Engineering (Contributor), Massachusetts Institute of Technology. Microphotonics Center (Contributor)
Format: Article
Language:English
Published: Institute of Electrical and Electronics Engineers (IEEE), 2012-09-27T21:21:42Z.
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