Exploiting cross-channel quantizer error correlation in time-interleaved analog-to-digital converters

Exploiting cross-channel quantizer error correlation in time-interleaved analog-to-digital converters

Uniform quantizers are often modeled as additive uncorrelated noise sources. This paper explores the validity of the additive noise model in the environment of time-interleaved A/D converters. Cross-channel quantizer error correlation is an important discrepancy that arises for channel time delays i...

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Bibliographic Details
Main Authors: McMichael, Joseph G. (Contributor), Maymon, Shay (Contributor), Oppenheim, Alan V. (Contributor)
Other Authors: Massachusetts Institute of Technology. Digital Signal Processing Group (Contributor), Lincoln Laboratory (Contributor), Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science (Contributor), Massachusetts Institute of Technology. Research Laboratory of Electronics (Contributor)
Format: Article
Language:English
Published: Institute of Electrical and Electronics Engineers (IEEE), 2013-07-22T21:10:21Z.
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