Residual stress in electrodeposited nanocrystalline nickel-tungsten coatings

Characterizing the residual stress of thick nanocrystalline electrodeposits poses several unique challenges due to their fine grain structure, thickness distribution, and matte surface. We use a three-dimensional profilometry-based approach that addresses each of these complicating factors and enabl...

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Bibliographic Details
Main Authors: Ziebell, Tiffany D. (Contributor), Schuh, Christopher A. (Contributor)
Other Authors: Massachusetts Institute of Technology. Department of Materials Science and Engineering (Contributor)
Format: Article
Language:English
Published: Cambridge University Press (Materials Research Society), 2013-08-05T18:16:51Z.
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