Infrared transmissometer to measure the thickness of NbN thin films

Infrared transmissometer to measure the thickness of NbN thin films

We present an optical setup that can be used to characterize the thicknesses of thin NbN films to screen samples for fabrication and to better model the performance of the resulting superconducting nanowire single photon detectors. The infrared transmissometer reported here is easy to use, gives res...

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Bibliographic Details
Main Authors: Sunter, Kristen A. (Contributor), Lang, Christopher I. (Contributor), Berggren, Karl K. (Contributor), Dane, Andrew Edward (Contributor)
Other Authors: Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science (Contributor), Massachusetts Institute of Technology. Research Laboratory of Electronics (Contributor)
Format: Article
Language:English
Published: Optical Society of America, 2015-11-09T14:18:41Z.
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