A comparative analysis of two-stage distress prediction models
Yes === On feature selection, as one of the critical steps to develop a distress prediction model (DPM), a variety of expert systems and machine learning approaches have analytically supported developers. Data envel- opment analysis (DEA) has provided this support by estimating the novel feature of...
| Main Authors: | , , |
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| Language: | en |
| Published: |
2018
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| Subjects: | |
| Online Access: | http://hdl.handle.net/10454/16705 |