Scanning tunneling microscopy in electrochemical environments
NOTE: Text or symbols not renderable in plain ASCII are indicated by [...]. Abstract is included in .pdf document. Scanning tunneling microscopy (STM) has been demonstrated to be an important analytical tool for the in situ characterization of electrode surfaces. However, in an electrochemical envi...
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| Format: | Others |
| Language: | en |
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1990
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| Online Access: | https://thesis.library.caltech.edu/2562/1/Heben_mj_1990.pdf Heben, Michael Joseph (1990) Scanning tunneling microscopy in electrochemical environments. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/8myg-1s98. https://resolver.caltech.edu/CaltechETD:etd-06122007-104233 <https://resolver.caltech.edu/CaltechETD:etd-06122007-104233> |
Internet
https://thesis.library.caltech.edu/2562/1/Heben_mj_1990.pdfHeben, Michael Joseph (1990) Scanning tunneling microscopy in electrochemical environments. Dissertation (Ph.D.), California Institute of Technology. doi:10.7907/8myg-1s98. https://resolver.caltech.edu/CaltechETD:etd-06122007-104233 <https://resolver.caltech.edu/CaltechETD:etd-06122007-104233>