SIMD-Swift: Improving Performance of Swift Fault Detection

The general tendency in modern hardware is an increase in fault rates, which is caused by the decreased operation voltages and feature sizes. Previously, the issue of hardware faults was mainly approached only in high-availability enterprise servers and in safety-critical applications, such as trans...

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Bibliographic Details
Main Author: Oleksenko, Oleksii
Other Authors: Technische Universität Dresden, Fakultät Informatik
Format: Dissertation
Language:English
Published: Saechsische Landesbibliothek- Staats- und Universitaetsbibliothek Dresden 2016
Subjects:
Online Access:http://nbn-resolving.de/urn:nbn:de:bsz:14-qucosa-192523
http://nbn-resolving.de/urn:nbn:de:bsz:14-qucosa-192523
http://www.qucosa.de/fileadmin/data/qucosa/documents/19252/Oleksenko_Oleksii_PDF_A.pdf