Scattering Scanning Near-Field Optical Microscopy on Anisotropic Dielectrics

Scattering Scanning Near-Field Optical Microscopy on Anisotropic Dielectrics

Near-field optical microscopy allows the nondestructive examination of surfaces with a spatial resolution far below the diffraction limit of Abbe. In fact, the resolution of this kind of microscope is not at all dependent on the wavelength, but is typically in the range of 10 to 100 nanometers. On t...

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Bibliographic Details
Main Author: Schneider, Susanne Christine
Other Authors: Technische Universität Dresden, Physik
Format: Doctoral Thesis
Language:English
Published: Saechsische Landesbibliothek- Staats- und Universitaetsbibliothek Dresden 2007
Subjects:
High-resolution optical microscopy
near-field microscopy
aperturless
scattering scanning near-field optical microscopy
SNOM
NSOM
s-SNOM
sSNOM
ferroelectrics
barium titanate
lithiumniobate
BTO
LNO
BaTiO3
LiNbO3
anisotropy
anisotropic dielec
Hochauflösende Mikroskopie
Nahfeldmikroskopie
aperturlos
aperturlose Nahfeldmikroskopie
streuende Nahfeldmikroskopie
Ferroelektrika
Bariumtitanat
Lithiumniobat
Anisotropie
anisotropic dielectri
ddc:530
rvk:VG 8907
Online Access:http://nbn-resolving.de/urn:nbn:de:swb:14-1192105974322-82865
http://nbn-resolving.de/urn:nbn:de:swb:14-1192105974322-82865
http://www.qucosa.de/fileadmin/data/qucosa/documents/579/1192105974322-8286.pdf

Internet

http://nbn-resolving.de/urn:nbn:de:swb:14-1192105974322-82865
http://nbn-resolving.de/urn:nbn:de:swb:14-1192105974322-82865
http://www.qucosa.de/fileadmin/data/qucosa/documents/579/1192105974322-8286.pdf

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