STIFFNESS CALIBRATION OF ATOMIC FORCE MICROSCOPY PROBES UNDER HEAVY FLUID LOADING

<p>This research presents new calibration techniques for the characterization of atomic force microscopy cantilevers. Atomic force microscopy cantilevers are sensors that detect forces on the order of pico- to nanonewtons and displacements on the order of nano- to micrometers. Several calib...

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Bibliographic Details
Main Author: Kennedy, Scott Joseph
Other Authors: Clark, Robert L
Published: 2010
Subjects:
Online Access:http://hdl.handle.net/10161/3121