Quantum Mechanical Effects on MOSFET Scaling

This thesis describes advanced modeling of nanoscale bulk MOSFETs incorporating critical quantum mechanical effects such as gate direct tunneling and energy quantization of carriers. An explicit expression of gate direct tunneling for thin gate oxides has been developed by solving the Schroinger equ...

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Bibliographic Details
Main Author: Wang, Lihui
Format: Others
Language:en_US
Published: Georgia Institute of Technology 2006
Subjects:
Online Access:http://hdl.handle.net/1853/11580