Radiative properties of silicon wafers with microroughness and thin-film coatings
The bidirectional reflectance distribution function (BRDF) that describes the scattered energy distribution is the most fundamental radiative property to calculate other properties. Although recent progress in surface metrology allows topography measurement in an atomic level, most studies still ass...
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| Format: | Others |
| Language: | en_US |
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Georgia Institute of Technology
2006
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| Online Access: | http://hdl.handle.net/1853/11586 |