Efficient Production Testing of High-Performance RF Modules and Systems using Low-Cost ATE

Efficient Production Testing of High-Performance RF Modules and Systems using Low-Cost ATE

The proliferation of wireless communication devices in the recent past has increased the pressure on semiconductor manufacturers to produce quality radio frequency (RF) modules and systems at a low cost. This entails reducing their test cost as well, since the cost of testing modern RF devices can b...

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Bibliographic Details
Main Author: Srinivasan, Ganesh Parasuram
Format: Others
Language:en_US
Published: Georgia Institute of Technology 2007
Subjects:
RF/mixed-signal DfT
Production testing
RF ATPG
RF testing
Low-cost test
Integrated circuits Testing
Integrated circuits Design and construction
Online Access:http://hdl.handle.net/1853/14113

Internet

http://hdl.handle.net/1853/14113

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