Built-In Self Test and Calibration of RF Systems for Parametric Failures

Built-In Self Test and Calibration of RF Systems for Parametric Failures

This thesis proposes a multifaceted production test and post-silicon yield enhancement framework for RF systems. The three main components of the proposed framework are the design, production test, and post-test phase of the overall integrated circuit (IC) development cycle. First, a circuit-sizing...

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Bibliographic Details
Main Author: Han, Dong-Hoon
Published: Georgia Institute of Technology 2007
Subjects:
Test
BIST
Calibration
RF circuits
Yield
Radio frequency integrated circuits Testing
Radio frequency integrated circuits Design and construction
Online Access:http://hdl.handle.net/1853/14507

Internet

http://hdl.handle.net/1853/14507

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