Built-In Self Test and Calibration of RF Systems for Parametric Failures
This thesis proposes a multifaceted production test and post-silicon yield enhancement framework for RF systems. The three main components of the proposed framework are the design, production test, and post-test phase of the overall integrated circuit (IC) development cycle. First, a circuit-sizing...
Main Author: | Han, Dong-Hoon |
---|---|
Published: |
Georgia Institute of Technology
2007
|
Subjects: | |
Online Access: | http://hdl.handle.net/1853/14507 |
Similar Items
-
Dual band passive RF components using partially coupled Stepped-impedance coupled lines.
Published: (2007) -
Model order reduction techniques for PEEC modeling of RF & high-speed multi-layer circuits.
Published: (2006) -
Methodologies for low-cost testing and self-healing of rf systems
by: Goyal, Abhilash
Published: (2012) -
Inductors in high-performance silicon radio frequency integrated circuits : analysis, modeling, and design considerations
by: Lutz, Richard D. Jr
Published: (2012) -
Steady-state analysis techniques for coupled device and circuit simulation
by: Hu, Yutao
Published: (2012)