Modeling hot-electron injection and impact ionization in pFET's

Modeling hot-electron injection and impact ionization in pFET's

Bibliographic Details
Main Author: Duffy, Christopher James
Published: Georgia Institute of Technology 2007
Subjects:
Electron impact ionization
Metal oxide semiconductors
Metal oxide semiconductor field-effect transistors
Online Access:http://hdl.handle.net/1853/14796

Internet

http://hdl.handle.net/1853/14796

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