Experimental and theoretical thermal analysis of microelectronic devices

Experimental and theoretical thermal analysis of microelectronic devices

Bibliographic Details
Main Author: Heng, Stephen Fook-Geow
Published: Georgia Institute of Technology 2007
Subjects:
Microelectronics
Heat Transmission
Online Access:http://hdl.handle.net/1853/16694

Internet

http://hdl.handle.net/1853/16694

Similar Items