A study of residual stresses in thin anisotropic (silicon) plates

A study of residual stresses in thin anisotropic (silicon) plates

Bibliographic Details
Main Author: Zheng, Tieyu
Published: Georgia Institute of Technology 2007
Subjects:
Strains and stresses Measurement
Structural engineering
Matter
Testing
Online Access:http://hdl.handle.net/1853/17516

Internet

http://hdl.handle.net/1853/17516

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