Vibrating Kelvin Probe Measurements of a Silicon Surface with the Underside Exposed to Light
This thesis addresses the use of a vibrating Kelvin probe to monitor the change in the front surface potential of a silicon wafer while the rear surface is illuminated with monochromatic, visible light. Two tests were run to verify the change in surface potential. One test increased the intensity...
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Georgia Institute of Technology
2008
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| Online Access: | http://hdl.handle.net/1853/19862 |