Development and advanced characterization of novel chemically amplified resists for next generation lithography

The microelectronics industry has made remarkable progress with the development of integrated circuit (IC) technology which depends on the advance of micro-fabrication and integration techniques. On one hand, next-generation lithography (NGL) technologies which utilize extreme ultraviolet (EUV) and...

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Bibliographic Details
Main Author: Lee, Cheng-Tsung
Published: Georgia Institute of Technology 2010
Subjects:
Online Access:http://hdl.handle.net/1853/31758