Constraint-driven RF test stimulus generation and built-in test
With the explosive growth in wireless applications, the last decade witnessed an ever-increasing test challenge for radio frequency (RF) circuits. While the design community has pushed the envelope far into the future, by expanding CMOS process to be used with high-frequency wireless devices, test m...
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Georgia Institute of Technology
2010
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| Online Access: | http://hdl.handle.net/1853/33913 |