Self-healing RF SoCs: low cost built-in test and control driven simultaneous tuning of multiple performance metrics

Self-healing RF SoCs: low cost built-in test and control driven simultaneous tuning of multiple performance metrics

The advent of deep submicron technology coupled with ever increasing demands from the customer for more functionality on a compact silicon real estate has led to a proliferation of highly complex integrated RF system-on-chip (SoC) and system-on-insulator (SoI) solutions. The use of scaled CMOS techn...

Full description

Bibliographic Details
Main Author: Natarajan, Vishwanath
Published: Georgia Institute of Technology 2011
Subjects:
Embedded sensors
Low-cost testing
Behavioral modeling
Wireless
OFDM
Calibration
Compensation
Tuning
Self-healing
Production testing
RF testing
Loop-back
Black box modeling
Parameter identification
Process variations
Yield
Receiver
Transmitter
Wireless communication systems
Microelectronics
Online Access:http://hdl.handle.net/1853/37165

Internet

http://hdl.handle.net/1853/37165

Similar Items