Reliability of SiGe HBTs for extreme environment and RF applications
The objective of the proposed research is to characterize the safe-operating-area of silicon-germanium (SiGe) heterojunction bipolar transistors (HBTs) under radiofrequency (RF) operation and extreme environments. The degradation of SiGe HBTs due to mixed-mode DC and RF stress has been modeled for t...
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ndltd-GATECH-oai-smartech.gatech.edu-1853-428362014-01-05T03:37:04ZReliability of SiGe HBTs for extreme environment and RF applicationsCheng, PengExtreme environmentSiGe HBTsRFPower amplifierBipolar transistorsHeterojunctionsSemiconductorsSiliconesGermaniumTransistorsThe objective of the proposed research is to characterize the safe-operating-area of silicon-germanium (SiGe) heterojunction bipolar transistors (HBTs) under radiofrequency (RF) operation and extreme environments. The degradation of SiGe HBTs due to mixed-mode DC and RF stress has been modeled for the first time. State-of-the-art 200 GHz SiGe HBTs were first characterized, and then DC and RF stressed. Excess base leakage current was modeled as a function of the stress current and voltage. This physics-based stress model was then designed as a sub-circuit in Cadence, and incorporated into SiGe power amplifier design to predict the DC and RF stress-induced excess base current. Based on these studies, characterization of RF safe-operating-area for SiGe HBTs using devices and circuits is proposed.Georgia Institute of Technology2012-02-17T19:21:55Z2012-02-17T19:21:55Z2010-11-17Dissertationhttp://hdl.handle.net/1853/42836 |
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Extreme environment SiGe HBTs RF Power amplifier Bipolar transistors Heterojunctions Semiconductors Silicones Germanium Transistors |
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Extreme environment SiGe HBTs RF Power amplifier Bipolar transistors Heterojunctions Semiconductors Silicones Germanium Transistors Cheng, Peng Reliability of SiGe HBTs for extreme environment and RF applications |
description |
The objective of the proposed research is to characterize the safe-operating-area of silicon-germanium (SiGe) heterojunction bipolar transistors (HBTs) under radiofrequency (RF) operation and extreme environments. The degradation of SiGe HBTs due to mixed-mode DC and RF stress has been modeled for the first time. State-of-the-art 200 GHz SiGe HBTs were first characterized, and then DC and RF stressed. Excess base leakage current was modeled as a function of the stress current and voltage. This physics-based stress model was then designed as a
sub-circuit in Cadence, and incorporated into SiGe power amplifier design to predict the
DC and RF stress-induced excess base current. Based on these studies, characterization of
RF safe-operating-area for SiGe HBTs using devices and circuits is proposed. |
author |
Cheng, Peng |
author_facet |
Cheng, Peng |
author_sort |
Cheng, Peng |
title |
Reliability of SiGe HBTs for extreme environment and RF applications |
title_short |
Reliability of SiGe HBTs for extreme environment and RF applications |
title_full |
Reliability of SiGe HBTs for extreme environment and RF applications |
title_fullStr |
Reliability of SiGe HBTs for extreme environment and RF applications |
title_full_unstemmed |
Reliability of SiGe HBTs for extreme environment and RF applications |
title_sort |
reliability of sige hbts for extreme environment and rf applications |
publisher |
Georgia Institute of Technology |
publishDate |
2012 |
url |
http://hdl.handle.net/1853/42836 |
work_keys_str_mv |
AT chengpeng reliabilityofsigehbtsforextremeenvironmentandrfapplications |
_version_ |
1716622965111521280 |