Modeling and Measurements of the Bidirectional Reflectance of Microrough Silicon Surfaces

Modeling and Measurements of the Bidirectional Reflectance of Microrough Silicon Surfaces

Bidirectional reflectance is a fundamental radiative property of rough surfaces. Knowledge of the bidirectional reflectance is crucial to the emissivity modeling and heat transfer analysis. This thesis concentrates on the modeling and measurements of the bidirectional reflectance for microrough sili...

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Bibliographic Details
Main Author: Zhu, Qunzhi
Format: Others
Language:en_US
Published: Georgia Institute of Technology 2005
Subjects:
Light Scattering
Slope distribution
Thin-film coating
Rough surface
AFM
BRDF
Thin films Testing
Reflectance
Silicon Testing
Online Access:http://hdl.handle.net/1853/5062

Internet

http://hdl.handle.net/1853/5062

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