Reconfigurable amplifiers and circuit components for built-in-self testing and self-healing in SiGe BiCMOS technology
The design of reconfigurable microwave and millimeter-wave circuit components and on-chip testing circuitry are demonstrated. These components are designed to enable the mitigation of process faults, aging, radiation effects, and other mechanisms that lead to performance degradation in circuits and...
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
Georgia Institute of Technology
2014
|
| Subjects: | |
| Online Access: | http://hdl.handle.net/1853/51823 |