Invasive and non-invasive detection of bias temperature instability
Invasive and non-invasive methods of BTI monitoring and wearout preemption have been proposed. We propose a novel, simple to use, test structure for NBTI /PBTI monitoring. The proposed structure has an AC and a DC stress mode. Although during stress mode, both PMOS and NMOS devices are stressed, the...
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Georgia Institute of Technology
2014
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| Online Access: | http://hdl.handle.net/1853/52227 |