Spectral radiative properties of thin films with rough surfaces using Fourier-transform infrared spectrometry
Thin films are used in many energy conversion applications, ranging from photodetectors to solar cells. Accurately predicting the radiative properties of thin films when they possess rough surfaces is critical in many instances, but can be challenging due to the complexity arising from light scatter...
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| Format: | Others |
| Language: | en_US |
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Georgia Institute of Technology
2005
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| Online Access: | http://hdl.handle.net/1853/5263 |