Fabrication and Testing of Heated Atomic Force Microscope Cantilevers
The invention of the atomic force microscope (AFM) revolutionized the scientific world by providing researchers with the ability to make topographical maps of both conducting and non-conducting surfaces with nanometer resolution. As an alternative to optical AFM methods, thermal cantilevers have be...
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| Format: | Others |
| Language: | en_US |
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Georgia Institute of Technology
2005
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| Online Access: | http://hdl.handle.net/1853/6890 |