Friction-induced artifact in atomic force microscopy topographic images
=== In Contact Mode Atomic Force Microscopy (CM-AFM), a cantilever with a sharp tip on its end is employed to acquire topographic information. Such acquisition is normally made by monitoring the deflection of the cantilever when it is in contact with the surface being scanned and using deflection v...
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| Format: | Others |
| Language: | Portuguese |
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Universidade Federal de Minas Gerais
2014
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| Online Access: | http://hdl.handle.net/1843/BUOS-9PQHRG |