Detec??o de defeitos do tipo Resistive-Open em SRAM com o uso de l?gica comparadora de vizinhan?a
Made available in DSpace on 2015-04-14T13:56:25Z (GMT). No. of bitstreams: 1 443096.pdf: 6133830 bytes, checksum: 908c7fe6bab5b7e729af71ec9803c982 (MD5) Previous issue date: 2012-03-30 === The world we live today is very dependent of the technology advance and the Systemson- Chip (SoC) are one of...
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | Portuguese |
| Published: |
Pontif?cia Universidade Cat?lica do Rio Grande do Sul
2015
|
| Subjects: | |
| Online Access: | http://tede2.pucrs.br/tede2/handle/tede/3045 |