The impact of voltage scaling over delay elements with focus on post-silicon tests

The impact of voltage scaling over delay elements with focus on post-silicon tests

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Bibliographic Details
Main Author: Heck, Guilherme
Other Authors: Calazans, Ney Laert Vilar
Format: Others
Language:English
Published: Pontif?cia Universidade Cat?lica do Rio Grande do Sul 2018
Subjects:
Delay Elements
Voltage Scaling
Asynchronous
Bundled-Data
Resiliency
Blade
Process
Post-Silicon Tests
Voltage and Temperature (PVT) Variations
Elementos de Atraso
Escalonamento de Tens?o
Ass?ncronos
Empacotamento de Dados
Resili?ncia
Varia??o de Processo
Tens?o de Temperatura
Teste P?s-Sil?cio
CIENCIA DA COMPUTACAO::TEORIA DA COMPUTACAO
Online Access:http://tede2.pucrs.br/tede2/handle/tede/8254

Internet

http://tede2.pucrs.br/tede2/handle/tede/8254

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