Detecção de defeitos do tipo Resistive-Open em SRAM com o uso de lógica comparadora de vizinhança
Made available in DSpace on 2013-08-07T18:53:24Z (GMT). No. of bitstreams: 1 000443096-Texto+Completo-0.pdf: 6133830 bytes, checksum: 908c7fe6bab5b7e729af71ec9803c982 (MD5) Previous issue date: 2012 === The world we live today is very dependent of the technology advance and the Systemson- Chip (So...
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| Language: | Portuguese |
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Pontifícia Universidade Católica do Rio Grande do Sul
2013
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| Online Access: | http://hdl.handle.net/10923/3188 |