Testing Of Analog Circuits - Built In Self Test

Testing Of Analog Circuits - Built In Self Test

On chip Built In Self Test (BIST) is a cost-effective test methodology for highly complex VLSI devices like Systems On Chip (SoC). This work deals with cost-effective BIST methods and Test Pattern Generation (TPG) schemes in BIST for fault detection and diagnosis of analog circuits. Fault-based test...

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Bibliographic Details
Main Author: Varaprasad, B K S V L
Other Authors: Patnaik, L M
Language:en_US
Published: 2009
Subjects:
Electronic Circuits - Testing And Measurements
Analog Circuits - Testing
Analog Built-In-Self-Test
Analog Fault Diagnosis
MultiDetect
Expo Tan
MultiDiag
Analog Testing
ATPG Technique
Analog Fault Modeling
Built In Self Test (BIST)
Electronic Engineering
Online Access:http://hdl.handle.net/2005/434

Internet

http://hdl.handle.net/2005/434

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