Reliability- and Variation-Aware Placement for Field-Programmable Gate Arrays
Field-programmable gate arrays (FPGAs) have the potential to address scaling challenges in CMOS technology because of their regular structures and the flexibility they possess by being re-configurable after fabrication. One of the potential approaches in attacking scaling challenges, such as negativ...
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Format: | Others |
Language: | en en |
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2009
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Online Access: | http://hdl.handle.net/1974/5217 |