Variability-Aware Design of Static Random Access Memory Bit-Cell
The increasing integration of functional blocks in today's integrated circuit designs necessitates a large embedded memory for data manipulation and storage. The most often used embedded memory is the Static Random Access Memory (SRAM), with a six transistor memory bit-cell. Currently, memories...
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| Language: | en |
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2008
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| Online Access: | http://hdl.handle.net/10012/3812 |