Electrostatic Discharge Protection Devices for CMOS I/O Ports

Electrostatic Discharge Protection Devices for CMOS I/O Ports

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In modern integrated circuits, electrostatic discharge (ESD) is a major problem that influences the reliability of operation, yield and cost of fabrication. ESD discharge events can generate static voltages beyond a few kilo volts. If these voltages are dissipated in the chip, high electric field an...

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Bibliographic Details
Main Author: Li, Qing
Language:en
Published: 2012
Subjects:
ESD Protection Devices
CDM
HBM
CMOS I/O Ports
Device Modeling
SCR
Electrical and Computer Engineering
Online Access:http://hdl.handle.net/10012/6944

Internet

http://hdl.handle.net/10012/6944

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