Evaluating count models for predicting post-release faults in object-oriented software
This thesis empirically compares statistical prediction models using fault count data and fault binary data. The types of statistical models that are studied in detail are Logistic Regression for binary data and Negative Binomial Regression for the count data. Different model building approaches are...
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| Format: | Others |
| Language: | en |
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McGill University
2001
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| Online Access: | http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=31228 |