Degradation processes and related reliability models
Reliability characteristics of new devices are usually demonstrated by life testing. When lifetime data are sparse, as is often the case with highly reliable devices, expensive devices, and devices for which accelerated life testing is not feasible, reliability models that are based on a combination...
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| Format: | Others |
| Language: | en |
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McGill University
1995
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| Online Access: | http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=39952 |