«In situ» study of amorphous semiconductor crystallization by dynamic transmission electron microscopy
Amorphous silicon is an important material of particular interest in the context of thin film transistors and display technologies. It also provides an ideal model system for the study of crystallization dynamics, and to this end we have investigated the crystallization of thin amorphous semiconduct...
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| Format: | Others |
| Language: | en |
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McGill University
2010
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| Online Access: | http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=86999 |