∆IDDQ Testing of a CMOS 12-Bit Charge Scaling Digital-to-Analog Converter
This work presents design, implementation and test of a built-in current sensor (BICS) for ∆IDDQ testing of a CMOS 12-bit charge scaling digital-to-analog converter (DAC). The sensor uses power discharge method for the fault detection. The sensor operates in two modes, the test mode and the normal m...
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| Format: | Others |
| Language: | en |
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LSU
2006
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| Online Access: | http://etd.lsu.edu/docs/available/etd-06292006-011812/ |