Characterization and Analysis of Hybrid Electronic Materials for Molecular Based Devices
The goal of this work is to characterize and to analyze hybrid electronic materials (HEMs) using fluorescence (FL) spectroscopy and conductive probe-atomic force microscopy (CP-AFM) in order to investigate the electrical and optical properties of these materials. Currently, research efforts to chara...
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| Format: | Others |
| Language: | en |
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LSU
2007
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| Online Access: | http://etd.lsu.edu/docs/available/etd-07122007-142343/ |