Design, Fabrication and Thermomechanical Testing of a Vertical Bimorph Sensor in the Wafer Plane
A bimetallic recurve device was designed, fabricated and tested as a temperature sensor. The device is to be used for sensing temperatures up to 300 C inside oil wells for downhole condition monitoring. Continuous downhole measurements at high temperatures and pressures are required to monitor condi...
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| Format: | Others |
| Language: | en |
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LSU
2004
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| Online Access: | http://etd.lsu.edu/docs/available/etd-08312004-140811/ |