Identification, Characterization and Mapping of LrCen, a New Leaf Rust (Puccinia triticina) Resistance Gene in Spring Wheat (Triticum aestivum)

Wheat leaf rust, caused by Puccinia triticina Eriks. (= P. recondita Rob. Ex Desmaz. f. sp. tritici), is the most widespread disease of wheat worldwide and causes average annual yield losses of 5 to 25%. The emergence of a new predominant race of leaf rust, TDBG, in the 2004 Canadian virulence surv...

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Bibliographic Details
Main Author: Boyce, Marley
Other Authors: Brûlé-Babel, Anita (Plant Science) Hiebert, Colin (Agriculture and Agri-Food Canada)
Published: 2016
Subjects:
Online Access:http://hdl.handle.net/1993/31604