Metrics for measuring the value of computer integrated manufacturing (CIM) systems
Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1994, and Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering, 1994 === Includes bibliographical references (leaves 129-136). === by William Wofford Crandall, Jr. === M.S.
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| Format: | Others |
| Language: | English |
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Massachusetts Institute of Technology
2005
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| Online Access: | http://hdl.handle.net/1721.1/12062 |