A metrological atomic force microscope
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2002. === Includes bibliographical references (p. 245-248). === This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections. ==...
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| Format: | Others |
| Language: | English |
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Massachusetts Institute of Technology
2005
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| Online Access: | http://hdl.handle.net/1721.1/16885 |