Interdigital dielectrometry based detection and identification of dangerous materials for security applications

Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2003. === Includes bibliographical references (p. 134-137). === This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Sp...

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Bibliographic Details
Main Author: Sears, Jason, 1978-
Other Authors: Markus Zahn.
Format: Others
Language:English
Published: Massachusetts Institute of Technology 2005
Subjects:
Online Access:http://hdl.handle.net/1721.1/17017