Stress evolution during growth and atomic-scale surface structure effects in transition-metal thin films
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 2004. === Includes bibliographical references (v.2, leaves 267-272). === Thin films are defined by an extremely high ratio of the in-plane dimensions to the thickness, resulting in very high surface-t...
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| Format: | Others |
| Language: | en_US |
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Massachusetts Institute of Technology
2005
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| Online Access: | http://hdl.handle.net/1721.1/28351 |